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National Science Foundation

Cyber-Physical Systems Virtual Organization

Read-only archive of site from September 29, 2023.

CPS-VO

Slacks

biblio

Visible to the public Slack removal for enhanced reliability and trust

Submitted by BrandonB on Wed, 05/06/2015 - 11:34am
  • Small Delay Defects
  • mission-critical application
  • pattern count
  • reliability enhancement
  • security of data
  • security vulnerabilities
  • security-critical application
  • slack removal
  • Slacks
  • malicious circuitries
  • test quality
  • testing
  • timing slacks
  • transition fault patterns
  • Trojan horses
  • trust enhancement
  • Wires
  • fabrication
  • care bit density intact
  • Circuit faults
  • delay defect detection
  • delay defects
  • delay unit insertion
  • delays
  • design for testability
  • design technique
  • At-speed Testing
  • Hardware
  • hardware trojan
  • Hardware Trojans
  • integrated circuit reliability
  • logic circuits
  • Logic gates
  • logic testing

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