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Cyber-Physical Systems Virtual Organization
Read-only archive of site from September 29, 2023.
CPS-VO
integrated circuit yield
biblio
Diagnosis of multiple faults with highly compacted test responses
Submitted by BrandonB on Wed, 05/06/2015 - 2:31pm
field return analysis
yield ramp-up
Response Compaction
process learning
probability
Multiple Faults
multiple fault probability
multiple fault diagnosis
MISR compactor
Mathematical model
logic diagnosis
linear properties
integrated circuit yield
integrated circuit testing
Accuracy
faulty signatures
fault diagnosis
Equations
embedded test
Diagnosis
defects cluster
compressed test responses
Compaction
compacted test responses
Circuit faults
built-in self-test
built-in self test
