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Cyber-Physical Systems Virtual Organization
Read-only archive of site from September 29, 2023.
CPS-VO
Multiple Faults
biblio
Application of multi-fault diagnosis based on discrete event system in industrial sensor network
Submitted by aekwall on Tue, 03/08/2022 - 2:36pm
multiple fault diagnosis
Trajectory
Multiple Faults
fault diagnosis
Discrete event system
diagnosability
circuit breakers
Discrete-Event Systems
cyber-physical systems
Resiliency
Metrics
pubcrawl
Couplings
Analytical models
Circuit faults
Human Factors
biblio
Representing Gate-Level SET Faults by Multiple SEU Faults at RTL
Submitted by grigby1 on Thu, 09/30/2021 - 12:54pm
multiple fault diagnosis
tools
SEU
set
semiconductor lasers
security
Safety
Resiliency
resilience
pubcrawl
Multiple Faults
Circuit faults
Metrics
Logic gates
Integrated circuit modeling
Human Factors
Human behavior
Hardware Security
functional safety
Fault injection
cyber physical systems
biblio
Multiple Fault Diagnosis for Sucker Rod Pumping Systems Based on Matter Element Analysis with F-statistics
Submitted by aekwall on Mon, 05/18/2020 - 10:49am
Metrics
sucker rod pumping wells
sucker rod pumping systems
Statistics
rods (structures)
Resiliency
pumps
pubcrawl
process control
Petroleum
oilfield production
oil technology
Multiple Faults
multiple fault diagnosis
cyber physical systems
matter-element analysis
matter element analysis
Knowledge Discovery
Human Factors
fuzzy systems
faults classification
fault diagnosis problem
fault diagnosis
F-statistics
dynamometers
dynamometer cards
down-hole working conditions
biblio
Diagnosis of multiple faults with highly compacted test responses
Submitted by BrandonB on Wed, 05/06/2015 - 2:31pm
field return analysis
yield ramp-up
Response Compaction
process learning
probability
Multiple Faults
multiple fault probability
multiple fault diagnosis
MISR compactor
Mathematical model
logic diagnosis
linear properties
integrated circuit yield
integrated circuit testing
Accuracy
faulty signatures
fault diagnosis
Equations
embedded test
Diagnosis
defects cluster
compressed test responses
Compaction
compacted test responses
Circuit faults
built-in self-test
built-in self test
