Skip to Main Content Area
CPS-VO
Contact Support
Browse
Calendar
Announcements
Repositories
Groups
Search
Search for Content
Search for a Group
Search for People
Search for a Project
Tagcloud
› Go to login screen
Not a member?
Click here to register!
Forgot username or password?
Cyber-Physical Systems Virtual Organization
Read-only archive of site from September 29, 2023.
CPS-VO
scan-based test
biblio
Dynamically obfuscated scan for protecting IPs against scan-based attacks throughout supply chain
Submitted by grigby1 on Tue, 01/23/2018 - 3:21pm
Resiliency
ip protection
Logic gates
noninvasive scan attacks
pattern generation time
Policy
policy-based governance
pubcrawl
Registers
intellectual property
scan-based attacks
scan-based test
Secure Scan
security
Supply Chain
supply chains
Testability
automatic test pattern generation
integrated circuits
integrated circuit testing
integrated circuit test flow
integrated circuit manufacturing
integrated circuit manufacture
integrated circuit design
industrial property
EDA generated scan chains
dynamically-obfuscated scan design
Discrete Fourier transforms
composability
collaboration
Clocks
chip security
boundary scan testing
