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National Science Foundation

Cyber-Physical Systems Virtual Organization

Read-only archive of site from September 29, 2023.

CPS-VO

sub-nanometer technology scale

biblio

Visible to the public Integrating Compiler Driven Transformation and Simulated Annealing Based Floorplan for Optimized Transient Fault Tolerant DSP Cores

Submitted by aekwall on Mon, 12/02/2019 - 12:07pm
  • simulated annealing
  • fault security
  • Finite impulse response filters
  • high performance devices
  • integrated circuit layout
  • integrated circuit reliability
  • low-power electronics
  • optimized low cost transient fault tolerant DSP core
  • optimized transient fault tolerant DSP
  • electronic device realibility
  • simulated annealing based floorplan
  • simulated annealing based optimization process
  • sub-nanometer technology scale
  • technology scaling
  • Transient fault
  • transient fault tolerant approach
  • compiler security
  • program compilers
  • Resiliency
  • pubcrawl
  • Metrics
  • Transient analysis
  • delays
  • fault tolerance
  • Fault tolerant systems
  • Compositionality
  • Scalability
  • battery operated low power
  • battery operated low power high performance devices
  • circuit optimisation
  • compiler driven transformation
  • contradictory design goal optimization
  • digital signal processing chips
  • DSP core

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