Visible to the public Mixed-Degradation Profiles Assessment of Critical Components in Cyber-Physical Systems

TitleMixed-Degradation Profiles Assessment of Critical Components in Cyber-Physical Systems
Publication TypeConference Paper
Year of Publication2019
AuthorsFrias, Alex Davila, Yodo, Nita, Yadav, Om Prakash
Conference Name2019 Annual Reliability and Maintainability Symposium (RAMS)
Keywordscompositionality, Computational modeling, CPS reliability profile, critical subsystem, cyber aspect, Cyber Dependencies, Cyber-physical systems, Data models, Degradation, degradation paths, degradation profiles, Hardware, human factors, Metrics, mix-degradation profiles, mixed-degradation profiles assessment, nonhomogeneous Poisson processes software reliability models, physical components, physical components degradation, physical-software systems, program testing, pubcrawl, reliability, Resiliency, Scalability, Software, software component failure data, software component profile, software components reliability, software reliability, software reliability perspective, Stochastic processes, telecommunication network reliability, Weibull distribution, Weibull software reliability model
AbstractThis paper presents a general model to assess the mixed-degradation profiles of critical components in a Cyber-Physical System (CPS) based on the reliability of its critical physical and software components. In the proposed assessment, the cyber aspect of a CPS was approached from a software reliability perspective. Although extensive research has been done on physical components degradation and software reliability separately, research for the combined physical-software systems is still scarce. The non-homogeneous Poisson Processes (NHPP) software reliability models are deemed to fit well with the real data and have descriptive and predictive abilities, which could make them appropriate to estimate software components reliability. To show the feasibility of the proposed approach, a case study for mixed-degradation profiles assessment is presented with n physical components and one major software component forming a critical subsystem in CPS. Two physical components were assumed to have different degradation paths with the dependency between them. Series and parallel structures were investigated for physical components. The software component failure data was taken from a wireless network switching center and fitted into a Weibull software reliability model. The case study results revealed that mix-degradation profiles of physical components, combined with software component profile, produced a different CPS reliability profile.
DOI10.1109/RAMS.2019.8769014
Citation Keyfrias_mixed-degradation_2019