Multiple-fault diagnosis of analog circuit with fault tolerance

A novel method, consisting of fault detection, rough set generation, element isolation and parameter estimation is presented for multiple-fault diagnosis on analog circuit with tolerance. Firstly, a linear-programming concept is developed to transform fault detection of circuit with limited accessible terminals into measurement to check existence of a feasible solution under tolerance constraints. Secondly, fault characteristic equation is deduced to generate a fault rough set. It is proved that the node voltages of nominal circuit can be used in fault characteristic equation with fault tolerance. Lastly, fault detection of circuit with revised deviation restriction for suspected fault elements is proceeded to locate faulty elements and estimate their parameters. The diagnosis accuracy and parameter identification precision of the method are verified by simulation results.