| Title | Capacitive Multi-Channel Security Sensor IC for Tamper-Resistant Enclosures |
| Publication Type | Conference Paper |
| Year of Publication | 2018 |
| Authors | Ferres, E., Immler, V., Utz, A., Stanitzki, A., Lerch, R., Kokozinski, R. |
| Conference Name | 2018 IEEE SENSORS |
| Date Published | oct |
| Keywords | Capacitance, capacitance 35.0 aF, capacitance 460.0 aF, capacitance measurement, capacitive multichannel security sensor IC, capacitive sensors, capacitive touch technology, Capacitors, CMOS integrated circuits, CMOS technology, composability, electrode matrix, Electrodes, embedded devices, Human Behavior, integrated circuit packaging, integrated circuits, Metrics, noise figure 94.6 dB, physical attacks, physical interaction, pubcrawl, Resiliency, security, Semiconductor device measurement, sensor fusion, sensor security, size 350.0 nm, SNR, tamper-resistant enclosures, time 19.7 ms |
| Abstract | Physical attacks are a serious threat for embedded devices. Since these attacks are based on physical interaction, sensing technology is a key aspect in detecting them. For highest security levels devices in need of protection are placed into tamper-resistant enclosures. In this paper we present a capacitive multi-channel security sensor IC in a 350 nm CMOS technology. This IC measures more than 128 capacitive sensor nodes of such an enclosure with an SNR of 94.6 dB across a 16x16 electrode matrix in just 19.7 ms. The theoretical sensitivity is 35 aF which is practically limited by noise to 460 aF. While this is similar to capacitive touch technology, it outperforms available solutions of this domain with respect to precision and speed. |
| DOI | 10.1109/ICSENS.2018.8589716 |
| Citation Key | ferres_capacitive_2018 |
Capacitive Multi-Channel Security Sensor IC for Tamper-Resistant Enclosures