Visible to the public ATPG-Guided Fault Injection Attacks on Logic Locking

TitleATPG-Guided Fault Injection Attacks on Logic Locking
Publication TypeConference Paper
Year of Publication2020
AuthorsJain, Ayush, Rahman, M Tanjidur, Guin, Ujjwal
Conference Name2020 IEEE Physical Assurance and Inspection of Electronics (PAINE)
Date Publisheddec
KeywordsCircuit faults, differential fault analysis, fault injection, Human Behavior, IC overproduction, IP piracy, laser theory, Logic gates, logic locking, pattern locks, pubcrawl, resilience, Resiliency, Scalability, security, semiconductor lasers, Tools
AbstractLogic Locking is a well-accepted protection technique to enable trust in the outsourced design and fabrication processes of integrated circuits (ICs) where the original design is modified by incorporating additional key gates in the netlist, resulting in a key-dependent functional circuit. The original functionality of the chip is recovered once it is programmed with the secret key, otherwise, it produces incorrect results for some input patterns. Over the past decade, different attacks have been proposed to break logic locking, simultaneously motivating researchers to develop more secure countermeasures. In this paper, we propose a novel stuck-at fault-based differential fault analysis (DFA) attack, which can be used to break logic locking that relies on a stored secret key. This proposed attack is based on self-referencing, where the secret key is determined by injecting faults in the key lines and comparing the response with its fault-free counterpart. A commercial ATPG tool can be used to generate test patterns that detect these faults, which will be used in DFA to determine the secret key. One test pattern is sufficient to determine one key bit, which results in at most \textbackslashtextbarK\textbackslashtextbar test patterns to determine the entire secret key of size \textbackslashtextbarK\textbackslashtextbar. The proposed attack is generic and can be extended to break any logic locked circuits.
DOI10.1109/PAINE49178.2020.9337734
Citation Keyjain_atpg-guided_2020