Visible to the public Golden Gates: A New Hybrid Approach for Rapid Hardware Trojan Detection Using Testing and Imaging

TitleGolden Gates: A New Hybrid Approach for Rapid Hardware Trojan Detection Using Testing and Imaging
Publication TypeConference Paper
Year of Publication2019
AuthorsShi, Qihang, Vashistha, Nidish, Lu, Hangwei, Shen, Haoting, Tehranipoor, Bahar, Woodard, Damon L, Asadizanjani, Navid
Conference Name2019 IEEE International Symposium on Hardware Oriented Security and Trust (HOST)
Date Publishedmay
ISBN Number978-1-5386-8064-3
Keywordsbackside ultra thinning, commercial systems, cyber physical systems, detection method, exhaustive test infrastructure, existing gate footprints, Foundries, GGC, golden chip, golden gate circuits, grave threat, Hardware, Hardware Trojans, high classification accuracy, high time cost, Image analysis, Imaging, integrated circuits, invasive software, Logic gates, Logic Test, low accuracy, malicious modifications, microscopy, modern military systems, new hybrid approach, pubcrawl, rapid hardware trojan detection, resilience, Resiliency, reverse engineering, scanning electron microscopy, security, SEM images, superlative accuracy, supply chain security, trojan horse detection, Trojan horses
Abstract

Hardware Trojans are malicious modifications on integrated circuits (IC), which pose a grave threat to the security of modern military and commercial systems. Existing methods of detecting hardware Trojans are plagued by the inability of detecting all Trojans, reliance on golden chip that might not be available, high time cost, and low accuracy. In this paper, we present Golden Gates, a novel detection method designed to achieve a comparable level of accuracy to full reverse engineering, yet paying only a fraction of its cost in time. The proposed method inserts golden gate circuits (GGC) to achieve superlative accuracy in the classification of all existing gate footprints using rapid scanning electron microscopy (SEM) and backside ultra thinning. Possible attacks against GGC as well as malicious modifications on interconnect layers are discussed and addressed with secure built-in exhaustive test infrastructure. Evaluation with real SEM images demonstrate high classification accuracy and resistance to attacks of the proposed technique.

URLhttps://ieeexplore.ieee.org/document/8741031
DOI10.1109/HST.2019.8741031
Citation Keyshi_golden_2019